Security-constrained unit commitment problem with transmission switching reliability and dynamic thermal line rating

dc.contributor.authorSheikh, Morteza
dc.contributor.authorAghaei, Jamshid
dc.contributor.authorLetafat, Armin
dc.contributor.authorRajabdorri, Mohammad
dc.contributor.authorNiknam, Taher
dc.contributor.authorShafie-Khah, Miadreza
dc.contributor.authorCatalão, João P. S.
dc.contributor.departmentVebic-
dc.contributor.facultyfi=Tekniikan ja innovaatiojohtamisen yksikkö|en=School of Technology and Innovations|-
dc.contributor.organizationfi=Vaasan yliopisto|en=University of Vaasa|
dc.date.accessioned2020-02-18T07:20:21Z
dc.date.accessioned2025-06-25T12:29:49Z
dc.date.available2020-02-18T07:20:21Z
dc.date.issued2019-10-07
dc.description.abstractIn security-constrained unit commitment (SCUC) problems, one approach to decrease operation costs is using a transmission switching (TS) tool. In SCUC problems with TS, one of the main challenges is that there is no limitation for the number of switching of circuit breakers (CB) in the system. In this article, the reliability of CB is merged into the SCUC problem with the TS and is considered as a limiting factor for switching. With a more reliable CB, the overall reliability of the system will be increased. So, it can be concluded that the reliability of a CB affects the amount of load shedding. Reliability of a CB is a nonlinear equation based on the number of switching in a period. An approach is presented to linearize the switch reliability equation. In this article, the power flow model uses an improved linear ac optimal power flow and a dynamic thermal line rating (DTLR) model, which considers the weather conditions. Other than CB reliability, DTLR in SCUC problems affects the number of switching and, as a result, operation costs will be significantly decreased. The proposed model is empowered by Bender's decomposition and is tested on 6-bus and 118-bus IEEE test systems.-
dc.description.reviewstatusfi=vertaisarvioitu|en=peerReviewed|-
dc.format.bitstreamtrue
dc.format.contentfi=kokoteksti|en=fulltext|-
dc.format.extent11-
dc.format.pagerange3933 - 3943-
dc.identifier.olddbid11443
dc.identifier.oldhandle10024/10521
dc.identifier.urihttps://osuva.uwasa.fi/handle/11111/329
dc.identifier.urnURN:NBN:fi-fe202002185684-
dc.language.isoeng-
dc.publisherIEEE-
dc.relation.doi10.1109/JSYST.2019.2939210-
dc.relation.ispartofjournalIEEE systems journal-
dc.relation.issn2373-7816-
dc.relation.issn1932-8184-
dc.relation.issue4-
dc.relation.urlhttps://doi.org/10.1109/JSYST.2019.2939210-
dc.relation.volume13-
dc.source.identifierhttps://osuva.uwasa.fi/handle/10024/10521
dc.subjectBenders’ decomposition-
dc.subjectdynamic thermal line rating (DTLR)-
dc.subjectexpected energy not supplied (EENS)-
dc.subjectlinear ac power flow-
dc.subjecttransmission switching (TS)-
dc.subject.disciplinefi=Sähkötekniikka|en=Electrical Engineering|-
dc.titleSecurity-constrained unit commitment problem with transmission switching reliability and dynamic thermal line rating-
dc.type.okmfi=A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä|en=A1 Peer-reviewed original journal article|sv=A1 Originalartikel i en vetenskaplig tidskrift|-
dc.type.publicationarticle-
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