Parametric and nonparametric event study tests : a review

Canadian Center of Science and Education (CCSE)
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vertaisarvioitu
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Osuva_Dutta_2014b.pdf - Lopullinen julkaistu versio - 1.45 MB

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©2014 by the authors. Published by Canadian Center of Science and Education (CCSE). This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license, http://creativecommons.org/licenses/by/4.0/, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
This paper presents a modest attempt to review the existing methodologies for measuring short-run abnormal performance of firms following certain corporate events. In doing so, the study discusses different parametric as well as nonparametric testing procedures available in the literature. Reviewing the prior literature reveals that the nonparametric sign and rank tests are better specified than parametric procedures. However, in case of detecting the short-run anomalies, we document that nonparametric tests have higher power relative to standard parametric approaches.

Emojulkaisu

ISBN

ISSN

1913-9012
1913-9004

Aihealue

Kausijulkaisu

International business research|7

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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä